Method for load-line correction of pulsed measurements
US8400179B1 · kind B1 · utility
3Cited by
5References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2009 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Mar 23, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2603
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for operating a measurement system having an interconnect between the measurement system and a device under test (DUT), the interconnect exhibiting voltage drops during measurements of the DUT, includes applying a test signal to the DUT through the interconnect, the test signal having a system value at the measurement system; measuring a resulting DUT value at the DUT; adjusting the system value according to the resulting DUT value to produce successive desired DUT values at the DUT; and using the successive DUT values to measure an electrical characteristic of the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.