Registration of an extended reference for parameter measurement in an optical sensing system

US8400620B2 · kind B2 · utility

Assignee

• Luna Innovations Incorporated · US

Inventors

• Mark E. Froggatt · Blacksburg, US
• Justin W. Klein · Blacksburg, US
• Dawn K. Gifford · Blacksburg, US
• Matthew T. Reaves · Baltimore, US
• Joseph J. Bos · Kalamazoo, US
• Alexander K. Sang · Blacksburg, US

Key dates

• Filing date: May 31, 2011
• Grant date: Mar 19, 2013
• Expiry date: Sep 21, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01L1/242
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain.