Solid modeling based on volumetric scans
US8401264B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2009 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Nov 5, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The geometry of an object is inferred from values of the signed distance sampled on a uniform grid to efficiently model objects based on data derived from imaging technology that is now ubiquitous in medical diagnostics. Techniques for automated segmentation convert imaging intensity to a signed distance function (SDF), and a voxel structure imposes a uniform sampling grid. Essential properties of the SDF are used to construct upper and lower bounds on the allowed variation in signed distance in 1, 2, and 3 (or more) dimensions. The bounds are combined to produce interval-valued extensions of the SDF, including a tight global extension and more computationally efficient local bounds that provide useful criteria for root exclusion/isolation, enabling modeling of the objects and other applications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.