Critical path monitor having selectable operating modes and single edge detection
US8405413B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 23, 2010 |
| Grant date | Mar 26, 2013 |
| Priority date | — |
| Expiry date | Jun 4, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A critical path monitor having selectable data output modes provides additional information about critical path delay variation. A pulse is propagated through a synthesized path representing a critical path in a functional logic circuit and a synthesized path delay is measured by a monitoring circuit that detects the arrival of an edge of the pulse at the output of the synthesized delay. The measured delay is provided as a real-time output and a processed result of the measured delay is processed according to a data output mode selected from multiple selectable output modes, thereby providing different information describing the real-time data about critical path delay, such as a range of edge positions corresponding to a variation of the critical path delay.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.