Inspection apparatus and inspection method
US8405715B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 18, 2008 |
| Grant date | Mar 26, 2013 |
| Priority date | — |
| Expiry date | Dec 11, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T156/1075
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Aims to provide an inspection apparatus and an inspection method for detecting an amount of misalignment of a component mounted on a panel through an ACF. The inspection apparatus detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a panel's top surface through an AFC, and includes: a visible light illuminator (304) which illuminates with visible light a panel recognition mark formed on the panel's top surface; an infrared light illuminator which is provided on a side of the component's bottom surface not adhered to the panel and illuminates with infrared light a component recognition mark formed on the component's top surface; a visible light camera (306) which is provided on a bottom surface side of the panel which is opposite to a side of the panel on which the component is mounted, and which captures an image of the panel recognition mark illuminated with the visible light; an infrared camera (307) which is provided on a side of a bottom surface of the component not adhered to the panel, and which captures an image of the component recognition mark illuminated with the infrared light; and an amount-of-misalignment calculation uni…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.