Method and apparatus for enhanced ion mobility based sample analysis using various analyzer configurations
US8410432B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2011 |
| Grant date | Apr 2, 2013 |
| Priority date | — |
| Expiry date | Aug 8, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.