On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
US8411282B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2011 |
| Grant date | Apr 2, 2013 |
| Priority date | — |
| Expiry date | Jun 9, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/361
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface wave assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.