Architectural data metrics overlay
US8413108B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2009 |
| Grant date | Apr 2, 2013 |
| Priority date | — |
| Expiry date | Jan 5, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3616
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for facilitating analysis of a software project. Intrinsic measures, activity-based measures, or dynamic measures associated with the project are received, including measures associated with physical program units and logical program units of the project. Mappings between physical program units and logical program units are generated. An architectural diagram including logical program units is received, and may include additional mappings of the logical program units. The mappings are used to roll up measures from physical project units to logical project units, and from logical project units to other logical project units. An overlay diagram is generated, including the rolled up measures. The overlay diagram includes the architectural diagram and a representation of rolled up measures associated with each logical project unit on the diagram. The representations employ a graphic format that facilitates a user determining risk areas of the software project. A user may view effects of project changes prior to checking them into source control.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.