Patent · US Active

System for NAND flash parameter auto-detection

US8417880B2 · kind B2 · utility

9Cited by

4References

20Claims

0Family size

Assignee

Hong Kong Applied Science and Technology Research Institute Company Limited · CN

Inventors

Chi Ho Lam
Ka Leung Ho · Sha Tin, CN

Key dates

Filing date	Nov 1, 2010
Grant date	Apr 9, 2013
Priority date	—
Expiry date	Jul 5, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/82
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A system comprising a NAND flash memory device having a multiplicity of parameters; a flash controller configured to perform a NAND flash memory parameter automatic detection process including reading a device identifier of the NAND flash memory device and proceeding if a valid device identifier value is returned, detecting an address cycle and a block type of the NAND flash memory device, detecting a page size of the NAND flash memory device, detecting a spare size of the NAND flash memory device, detecting a memory size of the NAND flash memory device, and detecting a block size of the NAND flash memory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.