Methods, apparatus and articles of manufacture to diagnose temperature-induced memory errors
US8418005B2 · kind B2 · utility
5Cited by
14References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 6, 2010 |
| Grant date | Apr 9, 2013 |
| Priority date | — |
| Expiry date | Apr 1, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Example methods, apparatus and articles of manufacture to diagnose temperature-induced memory errors are disclosed. A disclosed example method to diagnose a temperature-induced memory error includes detecting a memory error associated with a memory device, and writing a highest measured temperature of the memory device in the memory device when the memory error is detected, the highest temperature measured temporally near the detected memory error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.