Patent · US Active

Microscope

US8420992B2 · kind B2 · utility

0Cited by

0References

14Claims

0Family size

Assignee

Carl Zeiss Micromanaging GmbH · DE

Inventors

Peter Kuehn · Jena, DE
Dietmar Schmidt · Kahla, DE
Thomas Mehner · Borgo San Lazzaro, DE

Key dates

Filing date	Oct 15, 2010
Grant date	Apr 16, 2013
Priority date	—
Expiry date	Nov 9, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/008
WIPO fieldOptics
WIPO sectorInstruments

Abstract

In microscopes, particularly laser scanning microscopes, for detecting light coming from a sample, it is known to protect detectors from excessively high light outputs by means of shutters in the detection beam path. Further, in order to measure the light output impinging on the detector when the detection beam path is closed, a portion of the light is coupled out of the detection beam path and directed to a monitor diode. Constructions of this kind are complicated and costly. In the microscope according to the invention, a monitor diode is arranged on the shutter in such a way that the monitor diode is situated in the detection beam path when the shutter is closed. This makes it possible in a simple manner to measure the light output in a microscope when the detection beam path is closed even without additionally coupling light out of the detection beam path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.