Method and system for crystallization and X-ray diffraction screening
US8422632B2 · kind B2 · utility
2Cited by
6References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 24, 2011 |
| Grant date | Apr 16, 2013 |
| Priority date | — |
| Expiry date | Jun 24, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated fluidic circuit includes a substrate layer and a first structure coupled to the substrate layer and including a plurality of channels. The first structure is configured to provide for flow of one or more materials through the plurality of channels. The integrated fluidic circuit also includes a second structure coupled to the substrate layer. The second structure includes a plurality of control channels configured to receive an actuation pressure. The integrated fluidic circuit is characterized by a thickness of less than 1.5 mm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.