Three-dimensional image analysis system, process device, and method thereof
US8422765B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 1, 2009 |
| Grant date | Apr 16, 2013 |
| Priority date | — |
| Expiry date | Oct 13, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20192
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A three-dimensional image analysis system, a process device for use in the three-dimensional image analysis system, and a method thereof are provided. The three-dimensional image analysis system is configured to generate a plurality of three-dimensional data of a three-dimensional image. The process device defines a plurality of horizontal scan lines and a plurality of vertical scan lines according to the three dimensional data, determines a preliminary edge information of the three-dimensional image according to the horizontal scan lines and the vertical scan lines, divides the three dimensional data into a plurality of groups, compares the groups to determine a plane information of the three-dimensional image, and determines an edge information of the three-dimensional image according to the preliminary edge information and the plane information. The method is adapted for the process device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.