System and method for remote temperature sensing
US8425113B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 2, 2009 |
| Grant date | Apr 23, 2013 |
| Priority date | — |
| Expiry date | Jun 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method are disclosed for temperature measurement that includes performing a first ΔVbe measurement of a first temperature of a diode circuit comprising a transistor and, subsequently, performing a first Vbe measurement of a second temperature of the diode circuit. A temperature difference is calculated between the second temperature and the first temperature. If the temperature difference is not greater than a predetermined amount, a second Vbe measurement of a third temperature of the diode circuit is subsequently performed. If the temperature difference is greater than the predetermined amount, a second ΔVbe measurement of the second temperature of the diode circuit is performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.