Patent · US Active

Manufacturing method of microcrystalline silicon film and manufacturing method of semiconductor device

US8426295B2 · kind B2 · utility

1Cited by
30References
18Claims
0Family size

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Inventors

Key dates

Filing dateOct 6, 2011
Grant dateApr 23, 2013
Priority date
Expiry dateOct 27, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/40
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

To provide a manufacturing method of a microcrystalline silicon film having both high crystallinity and high film density. In the manufacturing method of a microcrystalline silicon film according to the present invention, a first microcrystalline silicon film that includes mixed phase grains is formed over an insulating film under a first condition, and a second microcrystalline silicon film is formed thereover under a second condition. The first condition and the second condition are a condition in which a deposition gas containing silicon and a gas containing hydrogen are used as a first source gas and a second source gas. The first source gas is supplied under the first condition in such a manner that supply of a first gas and supply of a second gas are alternately performed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.