In-situ gain calibration of radio frequency devices using thermal noise
US8428194B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 2012 |
| Grant date | Apr 23, 2013 |
| Priority date | — |
| Expiry date | Feb 17, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W52/40
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
An apparatus for calibrating gain of an radio frequency receiver (“Rx”) is disclosed to provide, among other things, a structure for performing in-situ gain calibration of an RF integrated circuit over time and/or over temperature without removing the RF integrated circuit from its operational configuration, especially when the gain of the RF integrated circuit is susceptible to variations in process, such as inherent with the CMOS process. In one embodiment, an exemplary apparatus includes a thermal noise generator configured to generate thermal noise as a calibrating signal into an input of an Rx path of an RF integrated circuit. The apparatus also includes a calibrator configured to first measure an output signal from an output of the Rx path, and then adjust a gain of the Rx path based on the thermal noise. In one embodiment, the thermal noise generator further includes a termination resistance and/or impedance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.