Methods and apparatus for single testing stimulus
US8429591B2 · kind B2 · utility
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2References
18Claims
0Family size
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Key dates
| Filing date | Mar 7, 2011 |
| Grant date | Apr 23, 2013 |
| Priority date | — |
| Expiry date | Mar 7, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318357
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus useful for improving the performance of testing and diagnostic operations on user circuit designs potentially across multiple phases of the development lifecycle and across multiple implementation technologies are described. As one example, a single testing and diagnostic stimulus source can variously provide test pattern data to different potential instantiations of the user circuit design by supporting and selectively utilizing a number of DUT-facing communication channels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.