Automatic configuration of a test environment
US8433953B1 · kind B1 · utility
62Cited by
6References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 13, 2007 |
| Grant date | Apr 30, 2013 |
| Priority date | — |
| Expiry date | Feb 21, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test for testing at least one of hardware or software in a first environment is generated. A desired test configuration is selected based on information regarding respective hardware or software. Test elements are automatically generated based on the desired test configuration, the test elements adapted to test at least one of the hardware or software. At least one of the hardware or software is automatically tested using a subset of the test elements. A result of testing is produced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.