Device for analysing materials by plasma spectroscopy
US8436991B2 · kind B2 · utility
19Cited by
1References
19Claims
0Family size
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Key dates
| Filing date | Nov 3, 2009 |
| Grant date | May 7, 2013 |
| Priority date | — |
| Expiry date | Feb 20, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for analyzing materials by plasma spectroscopy is of the portable and independent type, comprising a housing (10) containing a laser generator (18) that emits laser pulses that are focused on the surface of a material to be analyzed by means of a parabolic mirror (32) that is movable in translation inside the housing in order to perform a series of spot measurements along a scan line on the surface of the material to be analyzed and in order to take a measurement from a calibration sample (50) mounted in the measurement endpiece (22) of the housing (10).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.