Method of trimming a thin film resistor, and an integrated circuit including trimmable thin film resistors
US8441335B2 · kind B2 · utility
1Cited by
16References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2010 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | May 25, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49082
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Apparatus and methods of trimming resistors are disclosed. In one embodiment, a method of controlling the PCR of a thin film resistor is provided. The method includes applying a first current to a resistor so as to alter a property of the resistor, and measuring the property of the resistor. Applying the first current and measuring the property of the resistor can be repeated until the PCR of the resistor is within an acceptable tolerance of a desired value for the property of the resistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.