Mass sensor
US8441635B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2010 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Jun 19, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mass sensor is provided for determining the mass of small objects. The mass sensor has a plurality of nanostructures attached to a substrate. The nanostructures and the substrate are irradiated with an electromagnetic wave to determine a first mechanical-electromagnetic resonant frequency of the mass sensor. After a particle is attached to the nanostructures, the substrate and the nanostructures to which the particle is attached are irradiated with an electromagnetic wave to determine a second mechanical-electromagnetic resonant frequency of the mass sensor. A mass of the particle is determined based on a difference between the first and second mechanical-electromagnetic resonant frequencies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.