Tunable thin-film filter
US8441710B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2010 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Feb 16, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/288
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An optical filter is provided, including a first plurality and second plurality of alternating first and second material layers, where the first plurality of layers is at a first angle to incident light and has a cut-on edge, and the second plurality of layers is at a second angle to the incident light and a cut-off edge; where polarization splitting of the first plurality of layers at the cut-on edge and polarization splitting of the second plurality of layers at the cut-off edge do not exceed approximately 1 percent for any first and second angle between approximately 0 and 40 degrees; and the s-stopband wavelength of the second plurality of layers is approximately less than or equal to the cut-on edge wavelength, which is less than the cut-off edge wavelength, which is approximately less than or equal to the s-stopband wavelength of the first plurality of layers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.