Seismic data acquisition and processing quality control
US8441891B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2009 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Aug 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2200/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to producing a quality control measure for use during data acquisition and/or data processing of, preferably, seismic data. While or after obtaining the data, a surface consistent decomposition of the data is performed. From the surface consistent decomposition, one may compute a decomposed logarithmic spectra, and from the decomposed logarithmic spectra, one may compute one or more residua. An error attribute based on the one or more residua can be formulated, analyzed, and output. The error attribute can be used as a quality control measure or the analysis result can be used to produce a quality control measure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.