Methods of evaluating the quality of two-dimensional matrix dot-peened marks on objects and mark verification systems
US8442297B2 · kind B2 · utility
4Cited by
9References
17Claims
0Family size
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Key dates
| Filing date | Feb 23, 2010 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Oct 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.