Scanning phase intracavity nanoscope
US8446592B1 · kind B1 · utility
21Cited by
5References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Aug 4, 2009 |
| Grant date | May 21, 2013 |
| Priority date | — |
| Expiry date | Dec 31, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/35
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Scanning Phase Intracavity Nanoscope as a measurement system can be realized with a reference laser cavity and a sample laser cavity superimposed upon each other to operatively propagate two laser beams. The sample laser cavity is operatively formed by the sample to be measured. A measurement of the sample is based on differences in the reference laser cavity and the sample laser cavity determined from difference in the two laser beams.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.