Method and installation for imaging
US8447115B2 · kind B2 · utility
0Cited by
5References
18Claims
0Family size
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Key dates
| Filing date | Nov 30, 2007 |
| Grant date | May 21, 2013 |
| Priority date | — |
| Expiry date | Jun 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T5/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
(a) a measurement F0(x, y, δt) of the signals detected is provided; (b) on the one hand a first value F1(X, y, δt) is provided, termed the “integration” value and on the other hand a second value F2(x, y, δt) termed the “count” value is provided; (c) a value Fe(x0, y0, δt) of a number of signals is estimated from a combination of first F1(X0, y0, δt) and second F2(x0, y0, δt) values, on the basis of a criterion of detection in the neighborhood.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.