Patent · US Active

Closure mechanism for pressure test chambers for testing electronic components, in particular ICs

US8449002B2 · kind B2 · utility

1Cited by

15References

10Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Andreas Nagy · Munich, DE
Maximilian Schaule · Mindelheim, DE
Manfred Eibl · Lamprechtshausen, AT
Stefan Kurz · Frankfurt, DE

Key dates

Filing date	Jul 1, 2008
Grant date	May 28, 2013
Priority date	—
Expiry date	Dec 30, 2028

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T292/225
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A closure mechanism for pressure test chambers for testing electronic components, in particular ICs, has a plurality of pivoting jaws. At least some of the pivoting jaws have at least one lifting apparatus which can be advanced to two interacting cavity elements, which surround a cavity, by means of the pivoting jaws. Furthermore, at least some of the pivoting jaws have at least one locking device in order to move spacer elements into an intermediate space between the associated pivoting jaws and the compressed cavity element, as a result of which the tightness of the cavity is maintained even when the lifting apparatuses are retracted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.