Patent · US Active

Method for making electrical test probe contacts

US8451015B2 · kind B2 · utility

2Cited by

8References

21Claims

0Family size

Assignee

Medtronic, Inc. · US

Inventors

Christian S. Nielsen · River Falls, US
Timothy T. Bomstad · Inver Grove Heights, US

Key dates

Filing date	Jul 30, 2009
Grant date	May 28, 2013
Priority date	—
Expiry date	Apr 11, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/385
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of testing an electrical component includes coupling the electrical component to at least a first probe, a second probe, and a third probe. The probes are in communication with a test control module. Furthermore, the method includes confirming that the probes are in sufficient electrical connection with the electrical component by allowing the test control module to supply a current through the electrical component via the first probe and the third probe, and simultaneously detecting a potential difference across the electrical component by the second probe and the third probe. Furthermore, the method includes testing a performance characteristic of the electrical component by supplying a redundant signal to the electrical component via at least two of the first probe, the second probe, and the third probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.