Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging
US8451452B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Apr 21, 2010 |
| Grant date | May 28, 2013 |
| Priority date | — |
| Expiry date | Aug 20, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and devices are disclosed for acquiring depth resolved aberration information using principles of low coherence interferometry and perform coherence gated wavefront sensing (CG-WFS). The wavefront aberrations is collected using spectral domain low coherence interferometry (SD-LCI) or time domain low coherence interferometry (TD-LCI) principles. When using SD-LCI, chromatic aberrations can also be evaluated. Methods and devices are disclosed in using a wavefront corrector to compensate for the aberration information provided by CG-WFS, in a combined imaging system, that can use one or more channels from the class of (i) optical coherence tomography (OCT), (ii) scanning laser ophthalmoscopy, (iii) microscopy, such as confocal or phase microscopy, (iv) multiphoton microscopy, such as harmonic generation and multiphoton absorption. For some implementations, simultaneous and dynamic aberration measurements/correction with the imaging process is achieved. The methods and devices disclosed can provide wavefront sensing in the presence of stray reflections from optical interfaces.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.