X-ray tomographic inspection system for the identification of specific target items
US8451974B2 · kind B2 · utility
66Cited by
302References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 26, 2010 |
| Grant date | May 28, 2013 |
| Priority date | — |
| Expiry date | Dec 14, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.