Text analysis devices, articles of manufacture, and text analysis methods
US8452767B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 2006 |
| Grant date | May 28, 2013 |
| Priority date | — |
| Expiry date | Jan 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Text analysis devices, articles of manufacture, and text analysis methods are described according to some aspects. In one aspect, a text analysis device includes processing circuitry configured to analyze initial text to generate a measurement basis usable in analysis of subsequent text, wherein the measurement basis comprises a plurality of measurement features from the initial text, a plurality of dimension anchors from the initial text and a plurality of associations of the measurement features with the dimension anchors, and wherein the processing circuitry is configured to access a viewpoint indicative of a perspective of interest of a user with respect to the analysis of the subsequent text, and wherein the processing circuitry is configured to use the viewpoint to generate the measurement basis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.