Method, system and program storage device for generating accurate performance targets for active semiconductor devices during new technology node development
US8453101B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 22, 2011 |
| Grant date | May 28, 2013 |
| Priority date | — |
| Expiry date | Nov 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are embodiments of a method, system and program storage device for generating accurate performance targets for active semiconductor devices during technology node development in order to reduce the number of iterations required for model extraction and/or to improve model quality. In these embodiments, initial sets of performance targets for related semiconductor devices are generated, e.g., by making assumptions based on hardware measurements taken from semiconductor devices in prior technology nodes. Additional processes are then performed on the initial sets of performance targets prior to the modeling stage in order to detect and resolve any inconsistencies between the data in the sets. Specifically, plotting techniques are performed with respect to the performance targets. The results are analyzed to detect any inconsistencies indicating that the performance targets are inaccurate and adjustments are made to the performance targets in order to resolve those inconsistencies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.