Drop test apparatus
US8453491B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 24, 2011 |
| Grant date | Jun 4, 2013 |
| Priority date | — |
| Expiry date | Jan 10, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M7/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A drop test apparatus performs a drop test on a product. The drop test apparatus includes a drop control module and a support module. The drop control module includes a bottom plate and a support beam substantially perpendicularly attached to the bottom plate. The support module is attached at a predetermined height to the support beam and includes a lever for detecting whether the product is placed in a desired position. A support panel is disposed at a first end of the lever for supporting the product. A second end of the lever is under a predetermined force for maintaining the lever in a balanced state when the product is placed in the desired position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.