Automatic determination of dynamic threshold for accurate detection of abnormalities
US8457928B2 · kind B2 · utility
367Cited by
7References
17Claims
0Family size
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Key dates
| Filing date | Jul 30, 2010 |
| Grant date | Jun 4, 2013 |
| Priority date | — |
| Expiry date | Jul 27, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/86
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An improved performance management technique allows automatic determination dynamic thresholds of a metric based on a baseline of the matching pattern. A pattern matching process is conducted against a set of baseline patterns to find the matching pattern. If a matching pattern is found, the baseline of the matching pattern is used as the dynamic threshold. A series of sanity checks are performed to reduce any false alarms. If the metric does not follow any pattern, a composite of baselines is selected as the dynamic threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.