Patent · US Active

Data storage device tester

US8458526B2 · kind B2 · utility

134Cited by

19References

34Claims

0Family size

Assignee

Western Digital Technologies, Inc. · US

Inventors

Lawrence J. Dalphy · Mission Viejo, US
Curtis E. Stevens · Irvine, US
Daniel K. Blackburn · Irvine, US

Key dates

Filing date	Mar 29, 2010
Grant date	Jun 4, 2013
Priority date	—
Expiry date	May 25, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG11B2220/80
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.