Method for testing electronic device
US8463570B2 · kind B2 · utility
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1References
12Claims
0Family size
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Key dates
| Filing date | Nov 12, 2010 |
| Grant date | Jun 11, 2013 |
| Priority date | — |
| Expiry date | Oct 16, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/26
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for testing an electronic device is implemented with a host computer. The host computer detects a test status of the electronic device. The host computer stores a test order table that indicates the test status and test order corresponding to the test status. The host computer transmits a test order based on the test status and the test order table to the electronic device. The electronic device executes a self-test based on the test order.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.