Patent · US Active

Generating a functional coverage model from a trace

US8464103B2 · kind B2 · utility

2Cited by

5References

17Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Yoram Simha Adler · Haifa, IL
Noam Behar · Haifa, IL
Dale E. Blue · Poughkeepsie, US
Orna X Orna Raz-Pelleg · Haifa, IL

Key dates

Filing date	Oct 24, 2010
Grant date	Jun 11, 2013
Priority date	—
Expiry date	Dec 9, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3676
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A functional coverage model may be generated based on a trace. The functional coverage model may comprise values of attributes. The values may be extracted from one or more entries comprised by the trace. Based upon a selection of a field of an exemplary entry, content of the corresponding fields in other entries may be extracted and utilized. In some exemplary embodiments, names of attributes may be extracted from the trace. In some exemplary embodiments, a reference trace may be utilized as a comparative baseline coverage by generating a functional coverage model based upon the reference trace and comparing coverage of a second trace in respect to the functional coverage model with the coverage of the reference trace.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.