Continuous index of refraction compensation method for measurements in a medium
US8467044B2 · kind B2 · utility
13Cited by
19References
12Claims
0Family size
Inventor
Key dates
| Filing date | Apr 18, 2012 |
| Grant date | Jun 18, 2013 |
| Priority date | — |
| Expiry date | Apr 18, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/52004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described herein are devices and methods for making extremely accurate measurements in a medium by continuously measuring the index of refraction of the medium such as water or biological tissue. Also described herein is a device for constantly measuring the index of refraction, and using the index of refraction data to constantly calibrate the optical measurement device. In addition, a primary measurement device (a ladar) that is optimized for data collection in a volume backscattering medium such as water or biological tissue is described, along with data results from the lab.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.