Dynamic light-scattering measuring apparatus using low-coherence light source and light-scattering measuring method of using the apparatus
US8467067B2 · kind B2 · utility
2Cited by
5References
3Claims
0Family size
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Key dates
| Filing date | Jul 1, 2010 |
| Grant date | Jun 18, 2013 |
| Priority date | — |
| Expiry date | Apr 23, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/4412
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.