Methods and apparatus for testing and integration of modules within an electronic device
US8467735B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2009 |
| Grant date | Jun 18, 2013 |
| Priority date | — |
| Expiry date | Dec 13, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/29
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus for analysis of electronic components such as radio transceivers (for example, WLAN, Bluetooth, cellular, GPS). In one embodiment, a “black box” is diagnosed in its final device application and layout, using a series of software test routines or suites. The test suites provide simultaneous monitoring of multiple non-overlapping status indicators. Each test suite can be selectively enabled or disabled, and may also provide runtime modification of one or more parameters, and or intelligent testing of system operation. In another embodiment, multiple black box modules within a single form factor device are simultaneously run; the interference levels between the black box modules (as well as other parameters) are independently measured, displayed and logged to the user. Exemplary embodiments are described in reference to a Bluetooth module and WLAN module operating within a spatially restricted device (such as a desktop/laptop computer, “smartphone”, Bluetooth mouse and keyboard).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.