Patent · US Active

Method for capping a MEMS wafer and MEMS wafer

US8470630B2 · kind B2 · utility

9Cited by
0References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 2009
Grant dateJun 25, 2013
Priority date
Expiry dateNov 2, 2029

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81C2203/0136
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

The invention relates to a method for capping a MEMS wafer (1), in particular a sensor and/or actuator wafer, with at least one mechanical functional element (10). According to the invention, it is provided that the movable mechanical functional element (10) is fixed by means of a sacrificial layer (14), and that a cap layer (19) is applied to, in particular epitaxially grown onto, the sacrificial layer (14) and/or to at least one intermediate layer (17) applied to the sacrificial layer (14). The invention also relates to a capped MEMS wafer (1).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.