Method for measuring intensity distribution of light
US8471132B1 · kind B1 · utility
3Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | Oct 1, 2012 |
| Grant date | Jun 25, 2013 |
| Priority date | — |
| Expiry date | Oct 1, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/023
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring intensity distribution of light is disclosed. The method includes the steps of manufacturing a superaligned carbon nanotube array arranged on a substrate; irradiating a top surface of the superaligned carbon nanotube array with a light source and changing the morphology of the top surface of the superaligned carbon nanotube array; and obtaining an intensity distribution of the light source by analyzing the morphology of the top surface of the superaligned carbon nanotube array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.