Fast scanning of a target region
US8471228B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 12, 2009 |
| Grant date | Jun 25, 2013 |
| Priority date | — |
| Expiry date | Feb 16, 2030 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N2005/1085
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention concerns a method for irradiating a target with a beam approaching target points, involving the following steps: Measuring at least one of the parameters relating to the position of the beam and the intensity of the beam, changing the beam as a function of the at least one measured parameter, particularly as a function of a variance relating to the at least one measured parameter. The method is characterized in that the at least one measured parameter is measured at the most once per target point. Furthermore, the invention concerns a device for irradiating a target in accordance with the invention-based method and a control system for controlling such a device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.