Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects
US8472020B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Feb 15, 2005 |
| Grant date | Jun 25, 2013 |
| Priority date | — |
| Expiry date | Nov 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B7/268
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for enhancing recording yields by monitoring dye polymer formation on a glass substrate is provided. After the glass substrate is coated with a dye polymer layer and before pits are formed on the dye-polymer coated glass, the dye polymer coated glass substrate is scanned to detect defects. The dye-polymer coated glass is discarded on the one hand if the defects detected through the scanning are at or above an unacceptable threshold level, and on the other hand data is written on the dye-polymer coated glass if the defects detected through the scanning are below the unacceptable threshold level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.