Circuits, systems and methods for adjusting clock signals based on measured performance characteristics
US8472278B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2010 |
| Grant date | Jun 25, 2013 |
| Priority date | — |
| Expiry date | Mar 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Circuits, systems, and related methods to measure a performance characteristic(s) associated with a semiconductor die and adjust a clock signal based on the measured performance characteristic(s) are provided. The adjusted clock signal can be used to provide a clock signal to a functional circuit provided in the semiconductor die to assure proper operation of the functional circuit while operating with performance, voltage, temperature (PVT) delay variations. In this regard, a performance monitoring circuit is provided in the semiconductor die that includes the functional circuit. As a result, the performance monitoring circuit may be exposed to similar delay variations as the functional circuit. The performance monitoring circuit is configured to measure a performance characteristic(s) associated with the semiconductor die. The performance characteristic(s) is used to adjust a clock signal to provide an adjusted clock signal to the functional circuit for proper operation based on the performance characteristic(s).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.