Patent · US Active

Method of measuring geometric variables of a structure contained in an image

US8478023B2 · kind B2 · utility

2Cited by

12References

5Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Michael Kaus · Hamburg, DE
Juergen Weese · Henstedt-Ulzburg, DE
Steven Lobregt · Eindhoven, NL

Key dates

Filing date	Sep 3, 2002
Grant date	Jul 2, 2013
Priority date	—
Expiry date	Feb 5, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06T2210/41
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention relates to a method of measuring geometric variables of a three-dimensional structure contained in an object from at least on image representing the object, having the following steps:—use of a deformable first model describing the structure, the shape of which model can be described by parameters,—adjustment of the first model to the structure in the image,—determination of the parameters at which the first model exhibits optimum conformity with the structure,—use of a deformable second model describing the structure, which second model in shape corresponds to the first model, and which in addition contains at least one geometric variable,—modification of the second model according to the parameters determined, and—derivation of the geometric variable(s) from the modified second model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.