Dip-based corrections for data reconstruction in three-dimensional surface-related multiple prediction
US8478531B2 · kind B2 · utility
2Cited by
3References
15Claims
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Key dates
| Filing date | Apr 7, 2010 |
| Grant date | Jul 2, 2013 |
| Priority date | — |
| Expiry date | Oct 6, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A best fitting trace in seismic data is determined for a desired trace to be reconstructed. A dip-based correction is calculated per trace and per sample for differences in azimuth, common midpoint coordinates, and offset between the best fitting trace and the desired trace. The dip-based correction is applied to the best fitting trace to reconstruct the desired trace for 3D surface-related multiple prediction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.