Nanocrystal memories and methods of forming the same
US8481386B2 · kind B2 · utility
4Cited by
0References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 9, 2010 |
| Grant date | Jul 9, 2013 |
| Priority date | — |
| Expiry date | Apr 26, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/035
Abstract
In one embodiment, a memory device includes a substrate, a tunneling oxide, a silicide nanocrystal floating gate, and a control oxide. The tunneling oxide is positioned upon a first surface of the substrate, the silicide nanocrystal floating gate is positioned upon the tunneling oxide, and the control oxide positioned upon the nanocrystal floating gate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.