Patent · US Active

Nanocrystal memories and methods of forming the same

US8481386B2 · kind B2 · utility

4Cited by
0References
9Claims
0Family size

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Key dates

Filing dateApr 9, 2010
Grant dateJul 9, 2013
Priority date
Expiry dateApr 26, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

In one embodiment, a memory device includes a substrate, a tunneling oxide, a silicide nanocrystal floating gate, and a control oxide. The tunneling oxide is positioned upon a first surface of the substrate, the silicide nanocrystal floating gate is positioned upon the tunneling oxide, and the control oxide positioned upon the nanocrystal floating gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.