Method and system for optical edge measurement
US8482743B2 · kind B2 · utility
5Cited by
12References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 20, 2005 |
| Grant date | Jul 9, 2013 |
| Priority date | — |
| Expiry date | Sep 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Edge data for an object are obtained by placing the object in front of a medium that has greater reflectance than the object, and both are illuminated by a light source. The contrast in image intensity obtained between the object and background enables the edges of the object to be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.