Patent · US Active

Emblem

US8487820B2 · kind B2 · utility

6Cited by

2References

7Claims

0Family size

Assignee

Mitsubishi Electric Corporation · JP

Inventor

Minoru Tajima · Yokohama, JP

Key dates

Filing date	Jan 21, 2008
Grant date	Jul 16, 2013
Priority date	—
Expiry date	May 1, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01S7/038
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An emblem includes a first thickness portion having a first thickness and a second thickness portion having a second thickness thinner than the first thickness. The first thickness is equal to an integral multiple of a half of an in-medium wavelength of the radar wave inside the first thickness portion. The second thickness is a thickness equal to an integral multiple of a half of the in-medium wavelength of the radar wave inside the second thickness portion. A difference between the first thickness and the second thickness is set to an integral multiple of a free-space wavelength of the radar wave.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.